Gate Capacitance Measurement Using a Self-Differential Charge-Based Capacitance Measurement Method PROJECT TITLE :Gate Capacitance Measurement Using a Self-Differential Charge-Based Capacitance Measurement MethodABSTRACT:In this letter, we tend to propose a self-differential charge-based mostly capacitance measurement(SDCBCM) method. It's specifically applied to measure MOSFET gate capacitance with high accuracy. SDCBCM has two main benefits. 1st, it employs a newly proposed self-differential method to derive the capacitance-voltage ( – ) curve of gate capacitance, therefore avoiding the amplification of systematic error during the differentiation. Second, it can operate at a terribly high frequency (five hundred MHz or additional), which for the first time permits the gate capacitance of actual operating frequency to be measured and reduces random error to a terribly low level. Compared with the previous work, the accuracy of our methodology is increased by tens of times. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Experimental Characterization of Physical Unclonable Function Based on 1 kb Resistive Random Access Memory Arrays Analytical Physical-Based Drain-Current Model of Amorphous InGaZnO TFTs Accounting for Both Non-Degenerate and Degenerate Conduction