Replacing Error Vector Magnitude Test with RF and Analog BISTs ABSTRACT:RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100% of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Concurrent Device/Specification Cause–Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures RF Front-End Test Using Built-in Sensors