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Design & Test of Computers

Design & Test of Computers mainly offers the methods used in the designing process and testing of electronic product hardware and supportive software. These mainly focuses on the current and near future practices and development sections of these fields. The topics mainly focused are IC/Module design, low-power design, electronic design automation, design verification, practical technology. We offer the real time projects for design and test of computers for students of Mtech, PhD and researchers.

List of articles in category Design & Test of Computers
No. Project Titles Abstract
1. Development and Control of a Compliant Asymmetric Antagonistic Actuator for Energy Efficient Mobility Abstract
2. Border gateway protocol graph: detecting and visualising internet routing anomalies Abstract
3. Zero-Voltage Ride-Through Capability of a Transformerless Back-To-Back System Using Modular Multilevel Cascade Converters for Power Distribution Systems Abstract
4. ANC-ERA: Random Access for Analog Network Coding in Wireless Networks Abstract
5. Metrocell Antennas: The Positive Impact of a Narrow Vertical Beamwidth and Electrical Downtilt Abstract
6. Fast Unscented Transformation-Based Transient Stability Margin Estimation Incorporating Uncertainty of Wind Generation Abstract
7. Feasibility of Energy-Autonomous Wireless Microsensors for Biomedical Applications: Powering and Communication Abstract
8. Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits Abstract
9. Bringing up a chip on the cheap Abstract
10. Applying the Model-View-Controller Paradigm to Adaptive Test Abstract
11. Concurrent Device/Specification Cause–Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures Abstract
12. Placement Optimization of Flexible TFT Digital Circuits Abstract
13. Powering the Future: Organic Solar Cells with Polymer Energy Storage Abstract
14. Pulsed-Latch Circuits: A New Dimension in ASIC Design Abstract
15. Replacing Error Vector Magnitude Test with RF and Analog BISTs Abstract
16. RF Front-End Test Using Built-in Sensors Abstract
17. Robust Circuit Design for Flexible Electronics Abstract
18. The Promise of Flexible Electronics Abstract
19. Getting Close to Your Computer Abstract
20. Long-Term Thermal Overstressing of Computers Abstract
21. Materials, Processing, and Testing of Flexible Image Sensor Arrays Abstract
22. Adaptive Testing: Dealing with Process Variability Abstract

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