Concurrent Device/Specification Cause–Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures PROJECT TITLE :Concurrent Device/Specification Cause–Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic SignaturesABSTRACT:Editor's note: Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Applying the Model-View-Controller Paradigm to Adaptive Test Replacing Error Vector Magnitude Test with RF and Analog BISTs