RF Front-End Test Using Built-in Sensors ABSTRACT:This article proposes a new class of sensors for built-in test in RF devices. These sensors are placed in close proximity to the DUT on the same substrate without being electrically connected to it. Instead, they monitor it by virtue of being subjected to the same process variations. The authors also describe other types of sensors they have studied, including DC probes, an envelope detector, and a current sensor. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Replacing Error Vector Magnitude Test with RF and Analog BISTs Robust Circuit Design for Flexible Electronics