Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test Set - 2015 PROJECT TITLE: Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test Set - 2015 ABSTRACT: A low-power test generation procedure that was developed earlier merges broadside check cubes that are derived from purposeful broadside tests so as to get a low-power broadside take a look at set. This has many advantages, most significantly, that take a look at cubes, that are derived from practical broadside tests, create practical operation conditions in subcircuits around the sites of detected faults. These conditions are preserved when a test cube is merged with alternative check cubes. This brief applies the same approach to the generation of an occasional-power skewed-load check set. The main challenge that this project addresses is the derivation of skewed-load test cubes from useful broadside tests. The project also considers the percentages of values that should be unspecified within the skewed-load test cubes in order to balance the requirement to form purposeful operation conditions with the necessity for test compaction. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest A Method of One-Pass Seed Generation for LFSR-Based Deterministic/Pseudo-Random Testing of Static Faults - 2015 Multiplexer based High Throughput S-box for AES Application - 2015