Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States PROJECT TITLE :Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States (2014)ABSTRACT :By allowing compressed tests to be stored on a tester, test data compression methods minimize the input test data volume. If each stored test is used for the development of many separate tests, additional reductions in the input test data volume can be achieved. By continuing to move the scan-in state for one or more additional clock cycles, skewed-load tests provide a rare opportunity to extend a stored test into many separate skewed-load tests. In this paper, this opportunity for test data volume reduction beyond test data compression is introduced. A method that starts from a given skewed-load test set is defined in the paper. By applying multiple tests based on each stored test, the technique eliminates tests from the test collection and restores the fault coverage. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Digitally Controlled Pulse Width Modulator for On-Chip Power Management Area-Delay Efficient Binary Adders in QCA
