Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States PROJECT TITLE : Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States (2014) ABSTRACT : Test data compression methods reduce the input test data volume by allowing compressed tests to be stored on a tester. Additional reductions in the input test data volume can be achieved if each stored test is used for producing several different tests. Skewed-load tests create a unique opportunity to expand a stored test into several different skewed-load tests by continuing to shift the scan-in state for one or more additional clock cycles. This opportunity for test data volume reduction beyond test data compression is introduced in this paper. The paper describes a procedure that starts from a given skewed-load test set. The procedure removes tests from the test set and recovers the fault coverage by applying several tests based on every stored test. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Area-Delay Efficient Binary Adders in QCA Digitally Controlled Pulse Width Modulator for On-Chip Power Management