Methodology for Standard Cell Compliance and Detailed Placement for Triple Patterning Lithography


As the feature size of semiconductor process further scales to sub-sixteen nm technology node, triple patterning lithography (TPL) has been regarded as one in all the most promising lithography candidates along with extreme ultraviolet, electron beam lithography, and directly self-assembly. M1 and call layers, which are sometimes deployed within commonplace cells, are the foremost critical and complicated parts for fashionable digital styles. Traditional design flow that ignores TPL in early stages could limit the potential to resolve all the TPL conflicts. In this paper, we tend to propose a coherent framework, including commonplace cell compliance and detailed placement, to enable TPL friendly style. Considering TPL constraints throughout early design stages, such as standard cell compliance, improves the layout decomposability. With the precoloring solutions of commonplace cells, we tend to present a TPL aware detailed placement where the layout decomposition and placement will be resolved simultaneously. Yet, we have a tendency to propose a linear dynamic programming to unravel TPL aware detailed placement with most displacement, that will achieve good trade-off in terms of runtime and performance. Experimental results show that our framework will achieve zero conflict, meanwhile can effectively optimize the stitch range and placement wire-length.

Did you like this research project?

To get this research project Guidelines, Training and Code... Click Here

PROJECT TITLE :Energy and Area Efficient Three-Input XOR/XNORs With Systematic Cell Design Methodology - 2017ABSTRACT:In this temporary, we have a tendency to propose three efficient three-input XOR/XNOR circuits as the foremost
PROJECT TITLE :A Synthesis Methodology for Ternary Logic Circuits in Emerging Device Technologies - 2017ABSTRACT:Automatic synthesis of digital circuits has played a key role in obtaining high-performance styles. Whereas considerable
PROJECT TITLE :A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar - 2017ABSTRACT:Alternatives to CMOS logic circuit implementations are under analysis for future scaled electronics. Memristor crossbar-based
PROJECT TITLE :Control and Performance Analysis Methodology for Scale-up of MMC Sub modules for Back-to-Back HVDC Applications - 2017ABSTRACT:The modular multilevel converter (MMC) may be a promising topology for both Medium Voltage
PROJECT TITLE :A Root-Locus Design Methodology Derived from the Impedance/Admittance Stability Formulation and Its Application for LCL Grid-Connected Converters in Wind Turbines - 2017ABSTRACT:This paper presents a systematic

Ready to Complete Your Academic MTech Project Work In Affordable Price ?

Project Enquiry