PROJECT TITLE :
Logic Testing with Test-per-Clock Pattern Loading and Improved Diagnostic Abilities - 2017
This paper describes a test response compaction system that preserves diagnostic information and permits performing a check-per-clock offline testing. The check response compaction system relies on a series of T flip-flops. The T flip-flop signature chain can preserve the information concerning the position of the primary occurrence of the erroneous take a look at response and the data regarding the clock cycle when the erroneous test response occurred. This information will be used for diagnostic purposes. The paper discusses the doable advantages and limitations of the proposed take a look at pattern compaction scheme. The influence of multiple errors on detection and localization capability of the compaction system and hardware overhead is discussed within the paper also.
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