Has Time Come to Switch From Duty-Cycled MAC Protocols to Wake-Up Radio for Wireless Sensor Networks? PROJECT TITLE :Has Time Come to Switch From Duty-Cycled MAC Protocols to Wake-Up Radio for Wireless Sensor Networks?ABSTRACT:Duty-cycled Medium Access Control (MAC) protocols certainly improve the energy potency of wireless networks. But, most of these protocols still suffer from severe degrees of overhearing and idle listening. These two issues forestall optimum energy usage, a vital side in energy-constrained wireless networks like wireless sensor networks (WSNs). Wake-up radio (WuR) systems drastically scale back these problems by completely switching off the nodes' microcontroller unit (MCU) and main radio transceiver until a secondary, very low-power receiver is triggered by a explicit wireless transmission, the so known as wake-up decision. Unfortunately, most WuR studies concentrate on theoretical platforms and/or custom-designed simulators. Each these factors cut back the associated usefulness of the obtained results. During this paper, we have a tendency to model and simulate a true, recent, and promising WuR hardware platform developed by the authors. The simulation model uses time and energy consumption values obtained in the laboratory and does not rely on custom-built simulation engines, but rather on the OMNET++ simulator. The performance of the WuR platform is compared to four of the foremost well-known and widely utilized MAC protocols for WSN underneath 3 real-world network deployments. The paper demonstrates how the employment of our WuR platform presents varied advantages in several areas, from energy efficiency and latency to packet delivery ratio and applicability, and provides the essential data for serious thought of switching duty-cycled MAC-based mostly networks to WuR. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Optimal Black Start Resource Allocation Characterizing Radiation and Stress-Induced Degradation in an Embedded Split-Gate NOR Flash Memory