Estimating the Process Yield of Multiple Characteristics With One-Sided Specifications PROJECT TITLE :Estimating the Process Yield of Multiple Characteristics With One-Sided SpecificationsABSTRACT:This paper proposes a procedure for estimating the process yield of multiple characteristics with one-sided specifications in a manufacturing process. The proposed process yield indices can be applied for a multivariate normality data or a multivariate non-normality data. These indices provide an exact measure of the overall process yield. Also, the approximate lower confidence bound for the true process yield is presented. Three examples are used to demonstrate the performance of the proposed approach. The results show that our procedure is an effective approach. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest GA Guided Cluster Based Fuzzy Decision Tree for Reactive Ion Etching Modeling: A Data Mining Approach Cost of Ownership/Yield Enhancement of High Volume Immersion Lithography Using Topcoat-Less Resists