Emission Source Microscopy Technique for EMI Source Localization PROJECT TITLE :Emission Source Microscopy Technique for EMI Source LocalizationABSTRACT:For giant, advanced systems with multiple sources at the identical frequency, localizing the sources of radiation usually proves troublesome. This paper presents an emission source microscopy (ESM) technique derived from artificial aperture radar (SAR) to localize radiating sources on a PCB. Close to-field scanning provides restricted data about the parts contributing to way-field radiation. This paper presents the source localization methodology, supported by simulation and measurement results. After localizing the sources, the so much-field contribution and the whole radiated power from every individual supply can be estimated. The results show that the proposed method will distinguish between multiple radiating sources on a complicated PCB. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Suboptimal aperture radar imaging by combination of pseudo-polar formatting and gridless sparse recovery method General formulation of winding factor for fractional-slot concentrated winding design