Simulating NBTI Degradation in Arbitrary Stressed Analog/ Mixed-Signal Environments PROJECT TITLE :Simulating NBTI Degradation in Arbitrary Stressed Analog/ Mixed-Signal EnvironmentsABSTRACT:A compact negative bias temperature instability (NBTI) model is presented by iteratively solving the RD equations during a easy means. The new compact model can handle arbitrary stress conditions while not solving time-consuming equations, and is hence, suitable for analogue/mixed-signal NBTI simulations in SPICE-like environments. The model has been implemented in Cadence ADE with Verilog-A and conjointly takes the stochastic impact of ageing into account. The simulation speed has increased at least a thousand times compared to classical RD models. The performance of the model has been validated by each RD theoretical solutions and one hundred forty-nm CMOS silicon measurement. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest A tutorial on the internet of things: from a heterogeneous network integration perspective Nanogap Embedded Transistor for Investigation of Charge Properties in DNA
