PROJECT TITLE :
Hardware-Efficient Built-In Redundancy Analysis for Memory With Various Spares - 2017
Memory capability continues to extend, and several semiconductor producing companies are attempting to stack memory dice for larger memory capacities. Thus, engineered-in redundancy analysis (BIRA) is of utmost importance as a result of the probability of fault prevalence increases with a larger memory capacity. A ancient spare structure that consists of easy rows and columns is somewhat inadequate for multiple memory blocks BIRA because the hardware overhead and spare allocation efficiency are degraded. The proposed BIRA uses numerous sorts of spares and will achieve a higher yield than a simple row and column spare structure. Herein, we tend to propose a BIRA which will achieve an optimal repair rate using various spare sorts. The proposed analyzer will exhaustively search not solely row and column spare sorts but conjointly international and local spare types. Moreover, this paper proposes a fault-storing content-addressable memory (CAM) structure. The proposed CAM is little and collects faults efficiently. The experimental results show a high repair rate with a little hardware overhead and a short analysis time.
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