PROJECT TITLE :
COMEDI: Combinatorial Election of Diagnostic Vectors From Detection Test Sets for Logic Circuits - 2017
Although the trendy automatic test pattern generation (ATPG) tools will efficiently manufacture close to-optimal test sets with high fault-coverage for a circuit-underneath-take a look at, a diagnostic test set (DTS), which is required for fault localization, is much additional difficult to construct. The DTS is used to analyze the responses of failing chips throughout manufacturing check for the purpose of identifying the basis reason for observed errors. In this paper, a novel technique for selecting a strong DTS for stuck-at faults from a pool of ATPG detection vectors is proposed. Unlike existing ways, this method does not use any diagnostic take a look at generation, circuit modification, or miter-based approach. It constructs a combinatorial cowl of the pool to determine a check set with high diagnostic coverage (DC). 2 variants of the covering algorithm are proposed based mostly on this system. The experimental results on several combinational and scan-primarily based benchmark circuits demonstrate the effectiveness of our method in terms of the size of the DTS, DC, and CPU time.
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