Preemptive Built-In Self-Test for In-Field Structural Testing - 2015
One-time factory testing of VLSI components after fabrication is insufficient within the deep submicron era. The product must be tested periodically in the sphere of application. Due to the complexity of the Systems on a Chip (SoCs), huge amounts of check data are needed. However in many embedded systems the capacity of the accessible memory may be a limited resource. Besides in real time embedded systems the in-field testing activities ought to be accommodated with the real-time constraints of the system. In this project we at 1st show the suitability of the LFSR-based mostly Take a look at-Knowledge Compression with Self-Stoppable Seeds method [ten] for in-field testing and we tend to provide the desired enhancements thus which will be used as a Preemptive Built-In Self-Check mechanism for in-field testing that is applied at the idle time intervals of a exhausting real-time embedded system with sporadic tasks. Then, primarily based on a probabilistic model and intensive simulations, we tend to show that in the proposed technique the time needed to use all the check vectors to the Circuit Under Take a look at is many times smaller than the time required when the testing procedure consists from a number of non-preemptive take a look at sessions. The proposed method achieves lower energy consumption for testing and significantly smaller fault detection latency times.
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