Skewed Load Test Cubes Based on Functional Broadside Tests for a Low Power Test Set - 2014
A low-power test generation procedure that was developed earlier merges broadside check cubes that are derived from practical broadside tests so as to get a coffee-power broadside check set. This has several benefits, most importantly, that take a look at cubes, that are derived from useful broadside tests, create practical operation conditions in subcircuits around the sites of detected faults. These conditions are preserved when a take a look at cube is merged with alternative test cubes. This transient applies an identical approach to the generation of a low-power skewed-load check set. The most challenge that this project addresses is the derivation of skewed-load take a look at cubes from useful broadside tests. The project additionally considers the percentages of values that ought to be unspecified within the skewed-load check cubes in order to balance the necessity to make useful operation conditions with the necessity for test compaction.
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