Sharing Logic for Built-In Generation of Functional Broadside Tests PROJECT TITLE : Sharing Logic for Built-In Generation of Functional Broadside Tests (2014) ABSTRACT : When built-in test generation is used for a design that can be partitioned into logic blocks, it is advantageous to identify groups of blocks whose tests have similar characteristics, and use the same built-in test generation logic for the blocks in each group. This paper studies this issue for a built-in test generation method that produces functional broadside tests. Functional broadside tests are important for addressing overtesting of delay faults as well as avoiding excessive power dissipation during test application. The paper discusses the design of the test generation logic for a group of logic blocks, and the selection of the groups. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Design and Estimation of delay, power and area for Parallel prefix adders Area-Delay Efficient Binary Adders in QCA