Reliability Performance of a 70-GHz Mixer in 65-nm Technology PROJECT TITLE :Reliability Performance of a 70-GHz Mixer in 65-nm TechnologyABSTRACT:A downconversion mixer using the double-balanced Gilbert cell structure is fabricated using 65-nm CMOS technology. The mixer most conversion gain is -zero.ninety three dB, IF output power at the one-dB compression point is -4 dBm, and IIP3 is half-dozen.twelve dBm with IF at one GHz. Yet, mixer reliability subjected to dynamic stress at elevated VDD is examined experimentally. Transistor measurement was investigated to supply physical insight into the stress impact on device and circuit degradation. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Robust Trench Buried-Guard-Ring-Based Termination for Charge Balanced Devices System Discovery and Signaling Transmission Using Bootstrap in ATSC 3.0
