Competing Fracture Modeling of Thin Chip Pick-Up Process PROJECT TITLE :Competing Fracture Modeling of Thin Chip Pick-Up ProcessABSTRACT: The IC chip ejecting and pick-up method in electronic assembly plays a essential role in advanced packaging since the success ratio and productivity are determined by the delamination of thin chips from the underlying substrate. For a chip-on-substrate structure subjected to a transverse focused load ensuing from the ejecting needle, a competing relationship between chip peeling-off and chip cracking is discovered from the attitude of integral structure. A competing index, $Gamma$, is defined to characterize the competing fracture behavior between cracking and peeling-off, and therefore the competing fracture mechanism is then uncovered fundamentally. Primarily based on the index, the results of chip geometry on competing behavior are investigated using the virtual crack-closure technique with dummy nodes. Essential thickness and length, which separate chip peeling-off and cracking modes, are found and that they represent the extremity of successful pick-up method. The crucial values are determined by important competing index, $Gamma=Gamma_c$. The competing mechanism uncovered applies to general decide-up method with numerous chip sizes and materials. The crucial sizes and the strategy of evaluating important values are meaningful for chip profile style, optimization of choose-up method, and propelling new styles of electronic assembly process, especially for skinny chips. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Electroless Ni Plating to Compensate for Bump Height Variation in Cu–Cu 3-D Packaging Effect of Nano-Particles on Heterogeneous Void Nucleation in No-Flow Underfill Materials