PROJECT TITLE :

Fine-Grained Fast Field-Programmable Gate Array Scrubbing

ABSTRACT:

Field-programmable gate arrays offer many relevant benefits for important systems, like flexibility and high performance. But, their use in essential systems needs efficient means to mitigate transient faults within the configuration bits. This paper focuses on an alternate mechanism to reduce the repair time of ancient scrubbing approaches. It depends on fine-grained error detection and partial reconfiguration. The fine-grained info is employed to dynamically select an optimized starting position for the scrubbing procedure, reducing the mean repair time. We tend to explore the planning house provided by the technique and propose an approach to form resilient diagnosis of configuration faults. The potency, scalability, and robustness of the proposed mechanisms are evaluated.