PROJECT TITLE :
Cell Variability Impact on the One-Selector One-Resistor Cross-Point Array Performance
This paper investigates the impact of cell variability on the browse performance of the one-selector one-resistor (1S1R) cross-purpose array. A variability-aware array-sizing analysis methodology is introduced, considering three freelance variability sources, namely, the info pattern randomness, the selector variability, and therefore the resistive switching part (RSE) variability. By analyzing the impact of every variability factor separately, we have a tendency to show that the info pattern randomness isn't an necessary contributor for the scan margin (RM) degradation. While the intrinsic RSE variability reflected in the narrowing of the ON/OFF RSE window degrades the RM, the selector variability adds to the present additional, mainly affecting the ON-state readout current, and inflicting extra RM degradation. To accommodate cell variability and guarantee acceptable browse performance, further cell performance margin is needed. The 1S1R necessities are extrapolated for one-Mb array, assuming variability-affected cells. It is found that, with a typical selector variability, a minimal RSE window of 5 and a selector [*fr1]-bias nonlinearity of ~8000 are needed to realize at least tenpercent RM.
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