In Situ Current Determination of a-Si/μc-Si Tandem Solar Cells via Transmission Measurements During Silicon PECVD


In situ optical transmission measurements performed during thin-film silicon plasma-enhanced chemical vapor deposition (PECVD) are presented. Hereto, the plasma emission was used as light source. With this setup information about thickness, crystallinity and absorption characteristic of the growing intrinsic silicon thin film can be obtained. By integrating the intrinsic layers in solar cells with p-i-n configuration, the layer information gained in situ during the PECVD process can be directly correlated to the generated short-circuit current of the solar cell. The intention of this paper is to show that, by using these transmission measurements for the estimation of solar cell currents, an in situ current matching of stacked a-Si/μc-Si tandem devices is possible, which is a useful extension of the process control techniques.

Did you like this research project?

To get this research project Guidelines, Training and Code... Click Here

PROJECT TITLE :The Tensions of In Situ VisualizationABSTRACT:In situ visualization is that the coupling of visualization software with a simulation or other information producer to process the data "in memory" before the info
PROJECT TITLE :In Situ Platform for Isothermal Testing of Thin-Film Mechanical Properties Using Thermal ActuatorsABSTRACT:An in situ tensile check platform has been developed to review the mechanical properties of thin-film metal
PROJECT TITLE :In Situ Eddy Analysis in a High-Resolution Ocean Climate ModelABSTRACT:An eddy may be a feature related to a rotating body of fluid, surrounded by a hoop of shearing fluid. Within the ocean, eddies are ten to one
PROJECT TITLE :A CMOS Spiking Neuron for Brain-Inspired Neural Networks With Resistive Synapses and In Situ LearningABSTRACT:Nanoscale resistive memory devices are expected to fuel dense integration of electronic synapses for
PROJECT TITLE :Silicon Odometers: Compact In Situ Aging Sensors for Robust System DesignABSTRACT:Circuit reliability issues such as bias temperature instability, hot carrier injection, time-dependent dielectric breakdown, electromigration,

Ready to Complete Your Academic MTech Project Work In Affordable Price ?

Project Enquiry