PROJECT TITLE :
Double-Tip Artifact Removal From Atomic Force Microscopy Images
The atomic force microscopy (AFM) permits the measurement of interactions at interfaces with nanoscale resolution. Imperfections in the shape of the tip usually lead to the presence of imaging artifacts, like the blurring and repetition of objects inside pictures. Generally, these artifacts will solely be avoided by discarding knowledge and replacing the probe. Underneath bound circumstances (e.g., rare, high-value samples, or extensive chemical/physical tip modification), such an approach is not possible. Here, we have a tendency to apply a unique deblurring technique, using a Bayesian framework, to yield a reliable estimation of the real surface topography while not any previous data of the tip geometry (blind reconstruction). A key contribution is to leverage the many recently successful body of work in natural image deblurring to resolve this drawback. We tend to focus specifically on the double-tip effect, where 2 asperities1 are gift on the tip, every contributing to the image formation mechanism. Finally, we demonstrate that the proposed technique successfully removes the double-tip result from high-resolution AFM pictures, which demonstrate this artifact whereas preserving feature resolution.1An asperity could be a localized sharp peak in the surface of an object.
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