A Test Selection Procedure for Improving the Accuracy of Defect Diagnosis - 2016


Procedures that were described earlier increase the accuracy of defect diagnosis by ignoring little subsets of tests in order to supply smaller candidate fault sets. The premise behind these procedures is that almost all of the tests during a given take a look at set are useful for defect diagnosis, and solely little numbers of tests need to be ignored. This paper makes the new observation that it is doable to use tiny subsets of tests to get more accurate diagnosis results. This paper describes a procedure that starts from an empty test set, and adds tests one by one. The take a look at selected at every iteration is that the one that leads to the tiniest candidate fault set. The addition of tests increases the number of candidate faults gradually. Experimental results for benchmark circuits demonstrate that the addition of tests provides a lot of candidate fault sets with higher degrees of accuracy than the removal of tests. One of these candidate fault sets can be used for failure analysis.

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