Test Versus Security Past and Present - 2014


Cryptographic circuits want to be protected against aspect-channel attacks, that target their physical attributes while the cryptographic algorithm is in execution. There can be numerous facet-channels, like power, timing, electromagnetic radiation, fault response, and so on. One such vital facet-channel is the design-for-testability (DfT) infrastructure present for effective and timely testing of VLSI circuits. The attacker will extract secret information stored on the chip by scanning out take a look at responses against some chosen plaintext inputs. The purpose of this project is to initial gift an in depth survey on the state-of-the-art in scan-primarily based side-channel attacks on symmetric and public-key cryptographic hardware implementations, each within the absence and presence of advanced DfT structures, such as take a look at compression and X-masking, which could create the attack difficult. Then, the prevailing scan attack countermeasures are evaluated for determining their security against known scan attacks. In addition, JTAG vulnerability and security countermeasures also are analyzed as part of the external test interface. A comparative space-timing-security analysis of existing countermeasures at numerous abstraction levels is presented in order to assist an embedded security designer build an informed selection for his intended application.

Did you like this research project?

To get this research project Guidelines, Training and Code... Click Here

PROJECT TITLE :Massive Streaming PMU Data Modelling and Analytics in Smart Grid State Evaluation based on Multiple High-Dimensional Covariance Test - 2018ABSTRACT:Analogous deployment of part measurement units (PMUs), the increase
PROJECT TITLE :Performance Analysis of Sequential Detection of Primary User Number Based on Multihypothesis Sequential Probability Ratio Test - 2018ABSTRACT:In cognitive radio networks, a priori data on the quantity of primary
PROJECT TITLE :Logic BIST with Capture-per-Clock Hybrid Test Points - 2018ABSTRACT:Logic engineered-in self-check (LBIST) is now increasingly used with on-chip check compression as a complementary answer for in-system check, where
PROJECT TITLE :A High Performance Scan Flip-Flop Design for Serial and Mixed Mode Scan Test - 2018ABSTRACT:Over the years, serial scan design has become the de-facto design for testability technique. The simple testing and high
PROJECT TITLE :COMEDI: Combinatorial Election of Diagnostic Vectors From Detection Test Sets for Logic Circuits - 2017ABSTRACT:Although the trendy automatic test pattern generation (ATPG) tools will efficiently manufacture close

Ready to Complete Your Academic MTech Project Work In Affordable Price ?

Project Enquiry