Trip Curves and Ride-Through Evaluation for Power Electronic Devices in Power System Dynamic Studies


Power Electronic devices are widely utilized in power grid related to masses and renewable energy sources. With increasing penetration levels of those devices, their response characteristics to short-circuit events will have significant impact on Power System dynamics. Power Electronic devices are sensitive to voltage sags; they might trip off line beneath severe voltage disturbances. The ride-through capability of those devices determines if they will remain on-line. In this paper, a generic technique is proposed on how to evaluate the ride-through capability of Power Electronic devices through trip curves. This technique could be a 2-step procedure. Step 1 is to form a trip curve of the device. Step two is to conduct a ride-through evaluation primarily based on the created trip curve and a brief-circuit study. Making a visit curve for a explicit type of Power Electronic devices is crucial and challenging. Three case studies are demonstrated during this paper on the trip curve creation for variable-frequency drives, dc drives, and solar photovoltaic inverters based mostly on native and international standards, power grid interconnection requirements, and manufacturer specifications. The proposed technique will serve as a general guideline for the trip curve creation for Power Electronic devices.

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