Double-Sampling Design Paradigm—A Compendium of Architectures PROJECT TITLE :Double-Sampling Design Paradigm—A Compendium of ArchitecturesABSTRACT:Aggressive technology scaling impacts dramatically parametric yield, life-span, and reliability of circuits fabricated in advanced nanometric nodes. These issues may become showstoppers when scaling deeper to the sub-10-nm domain. To mitigate them, various approaches have been proposed, including increasing guard bands, fault-tolerant design, and canary circuits. Each of them is subject to several of the following drawbacks: large area, power, or performance penalty; false positives; false negatives; and insufficient coverage of the failures encountered in the deep nanometric domain. This paper presents various double-sampling architectures, which allow mitigating all these failures at low area and performance penalties and also enable significant power reduction. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Study on Ag-Plated Cu Lead Frame and Its Effect to LED Performance Under Thermal Aging Reliability Concerns Related With the Usage of Inorganic Particles in White Light-Emitting Diodes