Double-Sampling Design Paradigm—A Compendium of Architectures PROJECT TITLE :Double-Sampling Design Paradigm—A Compendium of ArchitecturesABSTRACT:Aggressive technology scaling impacts dramatically parametric yield, life-span, and reliability of circuits fabricated in advanced nanometric nodes. These problems may become showstoppers when scaling deeper to the sub-10-nm domain. To mitigate them, varied approaches are proposed, as well as increasing guard bands, fault-tolerant style, and canary circuits. Every of them is subject to many of the following drawbacks: large area, power, or performance penalty; false positives; false negatives; and insufficient coverage of the failures encountered in the deep nanometric domain. This paper presents various double-sampling architectures, that permit mitigating all these failures at low area and performance penalties and conjointly enable important power reduction. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Optimized Controller Design for $LCL$-Type Grid-Connected Inverter to Achieve High Robustness Against Grid-Impedance Variation Estimation of Fractional Vegetation Cover in Semiarid Areas by Integrating Endmember Reflectance Purification Into Nonlinear Spectral Mixture Analysis
