A Bayesian sequential testing method is proposed to evaluate system reliability index with reliability growth during development. The method develops a reliability growth model of repairable systems for failure censored test, and figures out the approach to determine the prior distribution of the system failure rate by applying the reliability growth model to incorporate the multistage test data collected from system development. Furthermore, the procedure for the Bayesian sequential testing is derived for the failure rate of the exponential life system, which enables the decision to terminate or continue development test. Finally, a numerical example is given to illustrate the efficiency of the proposed model and procedure.
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