Experimental Validation of Charge-Sensitive Amplifier Configuration that Compensates for Detector Capacitance


This paper presents measurement results of a method by which the shapes of the output signals derived from a front-end readout circuit will be created insensitive to the input detector capacitance, to a degree limited solely by the accuracy with that one will build an amplifier with unity gain. A charge sensitive amplifier including the detector capacitance compensation technique was implemented in a very normal a hundred and eighty-nm CMOS technology with a three.three-V provide voltage. The results show that the technique can successfully mitigate the performance degradation that accompanies large detector capacitance derived from either large-space radiation sensors and/or high permittivity materials, like nanocrystalline assemblies. So as to verify the feasibility of the technique, we tend to measured alpha particle spectra on 2 totally different sized silicon detectors that have detector capacitances of 1.26 pF and twenty one.eighty four pF, derived from 2-mm- and 10-mm-diameter devices, respectively. A configuration for integrating the fabricated preamplifier with a detector is also described to take advantage of the technique for any alternative application or experiment.

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