PROJECT TITLE :

Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes

ABSTRACT:

An accelerated degradation take a look at (ADT) will be used to assess the reliability of highly reliable merchandise by using degradation information. In this study, to exhibit a monotone increasing pattern, the gamma process is used to model the degradation of a product subject to a relentless-stress ADT of two loadings. Maximum likelihood estimates (MLEs) of the parameters of the ADT model were obtained. Given a budget for the overall price, an optimal ADT procedure was established to attenuate the asymptotic variance of the MLE of the mean time to failure of a product, and the sample size and termination time of each run of the ADT at a relentless measurement frequency were determined. An algorithm is provided to achieve an optimal ADT set up. An in depth Monte Carlo simulation was implemented to evaluate the sensitivity of the MLE variations to the sample size. A lumen degradation knowledge set of sunshine emitting diodes is presented to illustrate the proposed technique.