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51 |
Nb-Doped $hbox_hbox_ $ as Charge-Trapping Layer for Nonvolatile Memory Applications |
Abstract
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52 |
Test and Repair Methodology for FinFET-Based Memories |
Abstract
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53 |
Electrical and Optical Characterization of R.F.-Sputtered CdTe Thin Films |
Abstract
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54 |
Study on Ag-Plated Cu Lead Frame and Its Effect to LED Performance Under Thermal Aging |
Abstract
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55 |
Double-Sampling Design Paradigm—A Compendium of Architectures |
Abstract
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56 |
Reliability Concerns Related With the Usage of Inorganic Particles in White Light-Emitting Diodes |
Abstract
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57 |
In Situ ESD Protection Structure for Variable Operating Voltage Interface Applications in 28-nm CMOS Process |
Abstract
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