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  3. Device and Materials Reliability
  4. Reliability Concerns Related With the Usage of Inorganic Particles in White Light-Emitting Diodes
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Category: Device and Materials Reliability
By MTech Projects
MTech Projects
08.Mar
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Reliability Concerns Related With the Usage of Inorganic Particles in White Light-Emitting Diodes

PROJECT TITLE :

Reliability Concerns Related With the Usage of Inorganic Particles in White Light-Emitting Diodes

ABSTRACT:

Although adding nonemitting inorganic particles to the silicone encapsulant can be a strategy to improve reliabilities of white light-emitting diodes (wLEDs), its validity depends on the inorganic/organic interface compatibility. This work employs ZnO nanoparticles (NPs) with different surface conditions to study the physical relationships between degradation of wLEDs and inorganic/organic interfaces. Experimentally, it is found that 1 wt% of ZnO@SiO2 NPs in lens can slow down the degradation rate of wLEDs under both UV exposure conditions and pressure cooking test conditions.

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