Pull-In Voltage and Fabrication Yield Analysis of All-Metal-Based Nanoelectromechanical Switches PROJECT TITLE :Pull-In Voltage and Fabrication Yield Analysis of All-Metal-Based Nanoelectromechanical SwitchesABSTRACT:We have a tendency to designed a 1-mask method for all-molybdenum-based laterally actuated nanoelectromechanical switches. The damascene-like method is intended to ensure a smooth, high-aspect ratio, and metal-to-metal mechanical contact. Primarily based on the statistical study of 800 devices, terribly high method yield will be achieved for mounted–mounted beam devices by choosing suitable device dimensions, i.e., the beam length versus beam width ratio should be 1.five. Typical failure modes also are discussed. [2014-0391] Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest Automated, Depth-Resolved Estimation of the Attenuation Coefficient From Optical Coherence Tomography Data Theoretical and Experimental Research on a Novel Small Tunable PCM System in Staggered Double Vane TWT