Cost-efficient Acceleration of Hardware Trojan Detection Through Fan-Out Cone Analysis and Weighted Random Pattern Technique


Extrinsic parasitic series resistance and mobility degradation are 2 vital parameters limiting the performance of multifinger microwave MOSFETs. During this paper, we tend to present a methodology to extract these parameters from measured drain-voltage versus gate-voltage characteristics at given constant values of drain current. Measured knowledge of multifinger microwave MOSFETs are used to check and verify the developed technique. The method needs only easy dc measurements on a single take a look at device.

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