Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests PROJECT TITLE :Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging TestsABSTRACT:We tend to have measured 5 major mechanisms that govern light-emitting diode (LED) degradation, calculated respective percentages, and identified the foremost influential mechanism during the time evolution of aging. After 480 h, due to the reduction of phosphor-conversion potency, the increase of non-radiative centers, the deterioration of thermal properties, the darkening of silicone resin lenses, and also the degradation of Ag reflective layers, approximately 42% of the typical optical power has decayed. At intervals this forty two%, Ag degradation contributes approximately twenty eightp.c (with the remaining fourteen% contributed by the degradation of silicone resin lenses), primarily because different chemical elements have deposited on the surface of Ag reflective layers, therefore lowering the reflectivity of those layers. The current work will facilitate draw the community's attention to lowering LED junction temperatures, and to the optimization of packaging designs. Did you like this research project? To get this research project Guidelines, Training and Code... Click Here facebook twitter google+ linkedin stumble pinterest A Method to Evaluate Total Supply Capability of Distribution Systems Considering Network Reconfiguration and Daily Load Curves E-CARP: An Energy Efficient Routing Protocol for UWSNs in the Internet of Underwater Things