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1 . Parallel Pseudo-Exhaustive Testing of Array Multipliers with Data-Controlled Segmentation - 2018 Abstract
2 . Logic BIST with Capture-per-Clock Hybrid Test Points - 2018 Abstract
3 . Flexible Architecture of Memory BISTs - 2018 Abstract
4 . Automotive Functional Safety Assurance by POST with Sequential Observation - 2018 Abstract
5 . A High Performance Scan Flip-Flop Design for Serial and Mixed Mode Scan Test - 2018 Abstract

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