Built-In Self Test

No	Project Titles	Abstract
1 .	Optimized Built-In Self-Repair for Multiple Memories - 2016	Abstract
2 .	Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded Memories - 2016	Abstract
3 .	Low-Cost and High-Reduction Approaches for Power Droop During Launch-On-Shift Scan-Based Logic BIST - 2016	Abstract
4 .	Statistical Framework and Built-In Self Speed-Binning System for Speed Binning Using On-Chip Ring Oscillators - 2016	Abstract

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