PROJECT TITLE :

Single-Event Soft Errors in CMOS Logic

ABSTRACT:

In this article, various mechanisms for combinational logic-related radiation induced soft errors such as SE-induced soft delays, SE clock jitter and clock pulse, and SE crosstalk effects have been discussed. Our analysis shows that increasing SE crosstalk noise and delay effects occur with smaller technologies. This work has finally discussed hardening techniques for SE crosstalk noise and delay. Results are shown using HSpice Simulations with interconnect and device parameters derived from Predictive Technology Model for 65 nm.