PROJECT TITLE :
Guest Editorial Special Issue on the 2015 IEEE International Instrumentation and Measurement Technology Conference Pisa, Italy, May 11–14, 2015
The thirty second annual IEEE International Instrumentation and Measurement Technology Conference ( MTC) was held in historic and stunning Pisa, Italy. The theme of the conference was “The Measurable of Tomorrow: Providing a Better Perspective on Advanced Systems.” The primary half of the title embraced the challenge of Galileo Galilei, “Measure what is measurable, and build measurable what's not thus,” while the second half referred to as for the instrumentation and measurement (I&M) community to face the increasing complexity of systems ensuing from the continual development of latest technologies.
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