PROJECT TITLE :

Diagnostic test-pattern generation targeting open-segment defects and its diagnosis flow

ABSTRACT:

As an open defect happens in one wire segment of the circuit, totally different logic values on the coupling wires of the physical layout may end in different faulty behaviours, that are thus called the Byzantine impact. Many previous researches specialise in the check and diagnosis of open defects but the pattern diagnosability has not properly addressed. Thus during this study, a highresolution diagnostic framework for open defects is proposed and consists of a diagnostic check-pattern generation (DTPG) and its diagnosis flow. The branch-and-bound search associated with controllability analysis is incorporated in satisfiability-based DTPG to get patterns for the target segment. Later, a definite diagnosis flow constructs the list of defect candidates in an exceedingly dictionary-based fashion followed by an inject-and-evaluate analysis to greatly scale back the amount of candidates for silicon inspection. Experimental results show that the proposed framework runs efficiently and deduces nearly one candidate for each open-segment defect on average among all ISCAS??eighty five benchmark circuits.