PROJECT TITLE :

Silicon Micromachined Device Testing by Infrared Low-Coherence Reflectometry

ABSTRACT:

With the development of silicon micromachining technologies, non-contact measurement techniques for in-depth non-harmful inspection of layered and microstructured samples are becoming increasingly relevant. In this paper, we tend to apply optical low-coherence reflectometry (OLCR) to detect the optical path between the interfaces of several silicon devices with characteristic distance in the range three–17 $mu textm$ . The implemented configuration relies on a fiberoptic Michelson interferometer that exploits infrared broadband radiation within the wavelength range of one.2–one.7 $mu textm$ , with coherence length shorter than two $mu textm$ , for performing spot tomographic measurements. OLCR enabled out-of-plane measurements on a MEMS linear accelerometer and in-plane measurements on vertical periodic silicon/air microstructures. The optical distance between hidden interfaces was found well in agreement with the design parameters. [2015-0108]


Did you like this research project?

To get this research project Guidelines, Training and Code... Click Here


PROJECT TITLE :Key Reconciliation Protocols for Error Correction of Silicon PUF Responses - 2017ABSTRACT:Physical unclonable functions (PUFs) are promising primitives for the light-weight authentication of an integrated circuit
PROJECT TITLE : Area-Aware Cache Update Trackers for Post silicon Validation - 2016 ABSTRACT: The internal state of the complex fashionable processors usually desires to be dumped out frequently during postsilicon validation.
PROJECT TITLE: A High Speed 256-Bit Carry Look Ahead Adder Design Using 22nm Strained Silicon Technology - 2015 ABSTRACT: During this project, a high speed 256-bit carry look ahead adder has been designed using 22nm strained silicon
PROJECT TITLE :Asymmetric Silicon Slot-Waveguide-Assisted Polarizing Beam SplitterABSTRACT:A silicon polarizing beam splitter is designed and fabricated based on an uneven slot waveguide structure while not adopting additional
PROJECT TITLE :Experimental Evidence for Coherent Perfect Absorption in Guided-Mode Resonant Silicon FilmsABSTRACT:We tend to experimentally verify a replacement category of coherent absorbers based mostly on guided-mode resonance

Ready to Complete Your Academic MTech Project Work In Affordable Price ?

Project Enquiry