PROJECT TITLE :
Estimation of Non-Idealities in Sigma-Delta Modulators for Test and Correction Using Unscented Kalman Filters
In this paper, an enhanced unscented Kalman filter is employed for the estimation of non-idealities in sigma-delta modulators. As sigma-delta modulator based mostly analog-to-digital converters are known to be prone to performance degradation from many circuit non-idealities, testing and choice of the manufactured chips in addition to post-correction procedures are needed to confirm a reliable performance. In contrast to most state-of-the art techniques, the proposed estimator is capable of simultaneously tracking a giant set of non-ideal parameters with high accuracy and in a very short offline time inside the vary of microseconds. 3 attainable implementations are proposed and it's shown how the technique is employed to perform an in situ non-ideality estimation and subsequent calibration of a manufactured chip, bringing the modulator into its designed performance vary. It's more demonstrated that the estimator will reliably detect the non-idealities over a big selection when intentionally degrading the performance of the chip by manually sweeping its trimming parameters. The presented hardware measurement results prove that the proposed technique is practically applicable to the test and/or calibration of sigma-delta data converters.
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