PROJECT TITLE :
Sliding Probe Methods for In Situ Nanorobotic Characterization of Individual Nanostructures
Sliding probe ways are designed for the in situ characterization of electrical properties of individual 1-D nanostructures. The key to achieving a high resolution is to stay the contact resistance constant by controlling the contact force and area between the specimen and the sliding probe. We tend to have developed several techniques and tools including differential sliding, flexible probes, and specimen-form-adaptable probes using nanorobotic manipulation. Compared with typical ways, these sliding probe ways enable in situ characterization with a higher resolution than conventional methods. Furthermore, they're superior for native property characterization, that is of explicit interest for heterostructured nanomaterials and defect detection.
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