Self-heating burn-in pattern generation based on the genetic algorithm incorporated with a BACK-like procedure


In integrated circuit (IC) burn-in, it is desirable to provide efficient input patterns to assist heating for circuit beneath test. This study proposes and demonstrates an approach which uses the genetic algorithm incorporating with a BACK-like procedure to get the patterns that produce the maximal and/or uniform node transition with power dissipation for burn-in application. A multi-step strategy is applied in the algorithm, and a transition live is outlined to guide the backtracing of the back-like procedure, improving the efficiency in searching the target patterns. Experimental results show that the approach generates higher pattern pairs which manufacture either the maximal transition count or the maximal power dissipation than that of all the opposite printed results. It's additionally ready to come up with the pattern sequence that achieves additional uniformly stressing, by 30p.c improvement statistically, for every gate of the circuit beneath check. The computation time, as a result of of using a divide-and-conquer strategy during this approach, is additionally reasonable, creating it helpful in the sensible IC burn-in application.

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