PROJECT TITLE :

Self-heating burn-in pattern generation based on the genetic algorithm incorporated with a BACK-like procedure

ABSTRACT:

In integrated circuit (IC) burn-in, it is desirable to provide efficient input patterns to assist heating for circuit beneath test. This study proposes and demonstrates an approach which uses the genetic algorithm incorporating with a BACK-like procedure to get the patterns that produce the maximal and/or uniform node transition with power dissipation for burn-in application. A multi-step strategy is applied in the algorithm, and a transition live is outlined to guide the backtracing of the back-like procedure, improving the efficiency in searching the target patterns. Experimental results show that the approach generates higher pattern pairs which manufacture either the maximal transition count or the maximal power dissipation than that of all the opposite printed results. It's additionally ready to come up with the pattern sequence that achieves additional uniformly stressing, by 30p.c improvement statistically, for every gate of the circuit beneath check. The computation time, as a result of of using a divide-and-conquer strategy during this approach, is additionally reasonable, creating it helpful in the sensible IC burn-in application.


Did you like this research project?

To get this research project Guidelines, Training and Code... Click Here


PROJECT TITLE : Depth Reconstruction From Sparse Samples: Representation, Algorithm, and Sampling - 2015 ABSTRACT: The fast development of 3D technology and computer vision applications has motivated a thrust of methodologies
PROJECT TITLE :Self-Heating Measurement of 14-nm FinFET SOI Transistors Using 2-D Time-Resolved EmissionABSTRACT:Self-heating of FinFET transistors may be a reliability concern, especially for large devices with dense arrays of
PROJECT TITLE :Direct Observation of Self-Heating in III–V Gate-All-Around Nanowire MOSFETsABSTRACT:Gate-all-around (GAA) MOSFETs use multiple nanowires (NWs) to realize target $I_mathrmscriptscriptstyle ON$ , together with
PROJECT TITLE :Analysis of Self-Heating Effect on Short Channel Amorphous InGaZnO Thin-Film TransistorsABSTRACT:We report on a skinny-flim transistor (TFT) degradation encountered in brief channel amorphous indium-gallium-zinc-oxide
PROJECT TITLE :Depth Reconstruction From Sparse Samples: Representation, Algorithm, and SamplingABSTRACT:The rapid development of 3D technology and pc vision applications has motivated a thrust of methodologies for depth acquisition

Ready to Complete Your Academic MTech Project Work In Affordable Price ?

Project Enquiry