PROJECT TITLE :
Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.
Radio-frequency reflectometry (RFR) is a technique that was developed to characterize the properties of transmission lines by observing reflected waveforms. Today, it is widely used in a selection of applications, starting from the detection of faulty wires in cables and objects buried in the ground to soil moisture detectors and the measurement of dielectric properties of blood. Recently, one necessary application of this method, which needs a very little quantity of applied power, was developed for the characterization of electronic nanostructures. In this implementation, a microwave radio-frequency (RF) signal is shipped to a resonator coupled to the specimen to be studied. If in a very specimen the modification of some external parameter (e.g., gate voltage) leads to a modification of a lively [Figure one(a)] or a reactive (usually, capacitive) load to the resonator, the self-resonance is affected, ensuing in an exceedingly change of magnitude [Figure two(a)] and section of the reflected signal. If an impedance matching condition is achieved, the modification of the specimen parameter (e.g., the rise of its resistance) can result in a very important amendment in the reflection coefficient. Here, we discuss 2 important applications of the RFR technique on nanoscale devices.
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