The scan rate and image resolution of the atomic force microscope (AFM) operating in tapping-mode may be im proved by modifying the quality (Q) factor of the AFM micro cantilever according to the sample type and imaging environment. Piezoelectric shunt control is a new method of controlling the Q factor of a piezoelectric self-actuating AFM microcantilever. The mechanical damping of the microcantilever is controlled by an electrical impedance placed in series with the tip oscillation circuit. A synthetic impedance was designed to allow easy modification of the control parameters which may vary with environmental conditions. The proposed techniques are experimentally demonstrated to reduce the Q factor of an AFM microcantilever from 297.6 to 35.5. AFM images obtained using this method show significant improvement in both scan rate and image quality.
Did you like this research project?
To get this research project Guidelines, Training and Code... Click Here