PROJECT TITLE :
Characterizing the Impact of Intermittent Hardware Faults on Programs
Extreme complimentary metal-oxide-semiconductor (CMOS) technology scaling is inflicting vital issues in the reliability of computer systems. Intermittent hardware errors are non-deterministic bursts of errors that occur in the same physical location. Recent studies have found that forty% of the processor failures in real-world machines are due to intermittent hardware errors. A study of the consequences of intermittent faults on programs may be a crucial step in building fault-tolerance techniques of cheap accuracy and cost. In this work, we tend to characterize the impact of intermittent hardware faults in programs using fault-injection campaigns in an exceedingly microarchitectural processor simulator. We have a tendency to realize that eightyp.c of the non-benign intermittent hardware errors activate a hardware trap within the processor, and also the remaining 20percent cause silent information corruptions. We have additionally investigated the possibility of using the program state at failure time in software-based mostly diagnosis techniques, and located that much of the erroneous data are intact and will be used to spot the supply of the error.
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